利用10K SNP芯片和玉米F2:3家系,共定位到18个与茎秆穿刺强度、茎粗和穗位高性状相关的QTL。其中5个茎杆穿刺强度QTL,分别位于第1、3、4、6、7染色体；4个茎粗QTL,分别位于第1、2、4、8染色体上；9个穗位高QTL,分别位于第1、2、3、4、6、7、8、9染色体上。此外,在第4染色体2.2-11.7 Mb区段上检测到同时控制地上第三节茎秆穿刺强度、茎粗和穗位高3个性状的QTL；在第8染色体C8M179标记(物理位置118, 050, 940 bp)附近检测到同时控制地上第三节茎粗和穗位高2个性状的QTL。

A total of 18 QTL for rind penetrometer resistance, stem diameter and ear height were identified, using the 10K SNP chip and maize F2:3 pedigree. Among them, 5 QTL for rind penetrometer resistance distributed on chromosomes 1, 3, 4, 6 and 7; 4 QTL for stem diameter distributed on chromosomes 1, 2, 4 and 8; 9 QTL for ear height distributed on chromosomes 1, 2, 3, 4, 6, 7, 8 and 9. Furthermore, the QTL controlling 3 traits (rind penetrometer resistance, stem diameter and ear height) were identified on the 2.2-11.7 Mb region of chromosome 4. Meanwhile, the QTL controlling 2 traits (stem diameter and ear height) were identified near the C8M179 marker (physical position 118, 050, 940 bp) on chromosome 8.

本研究由河南省科技开放合作项目(162106000012)和河南省农业科学院青年国际交流基金共同资助。